NANO-TEC at the Design Automation & Test (DATE) Conference 2012

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Plenum DATE 2012

At this year's Design Automation and Test Concerence in Europe, the NANO-TEC project presented its current status and achievements. In an Embedded Tutorial in the Special Session 2.8. entitled "Beyond CMOS - Benchmarking for Future Technologies" some of the project partners introduced NANO-TEC to about 50 attendants from the design community.

For pictures and for download the slides go here.